On November 4, 2009, USITO, SEMI and TechAmerica jointly hosted our ongoing program, the Customs and Export Controls event in Shanghai. The speakers shared their views on the Validated End User (VEU) program and enforcement, the U.S. export licensing for companies in China, as well as industry perspectives on export controls. Members please click here for the ppt of the speaker John Larkin of LTI, and click here for that of Grace Wang from Lam Research Corp. Members not attending the event are also welcome to contact us for details.